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    Flash Memory Chip Intelligent Test System Product Description: The Smart Test System YC-N8-NAND is a comprehensive flash memory test system that can be customized to test up to 8 flash particles in parallel. It supports a wide range of test patterns and customized test parameters. It provides a one-click basic test flow, highly flexible experimental test, and advanced test flow, and can It provides one-click basic test... more
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    Hai Da Labtester
    [Guangdong,China]
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    Wafer:Industrial Grade KIOXIA Wafer

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